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Focus - Micromeritics Software Engineering Support

Focus - Micromeritics Software Engineering Support - 10/05/2005

Focus - Micromeritics Software Engineering Support As a manufacturer of computer-controlled automatic analytical laboratory instruments, Micromeritics understands the importance software plays in the overall quality of the end product. Software not only controls and monitors our instruments; it gathers, reduces and reports data, and provides an interface between the instrument and the operator. To ensure ongoing development and support of superior software, Micromeritics employs an in-house software engineering department with experience that is extensive and varied. Stefan Koch, Software Engineering Manager, received his Bachelor of Science in Physics and Mathematics from Allegheny College and his Masters in Science from Cornell University. Prior to joining Micromeritics, Mr. Koch performed software development for RJ Lee Group (a company that manufactures Electron microscopes). Sam Varner earned a Bachelor's Degree in Physics from the Indiana University of Pennsylvania and PhD at the College of William and Mary where he developed experimental and computational techniques in solid-state nuclear magnetic resonance. Dr. Varner joined Micromeritics after a year of post-doctoral study at the University of Illinois at Chicago. Bill Conklin (Bachelor of Science in Computer Science and Engineering from the Massachusetts Institute of Technology) has been involved in software development and instrument design at Micromeritics for over 25 years and is co-inventor for several Micromeritics patents. Gary Austin, Phi Beta Kappa at Rutgers College, has done department management and software development at Lanier Business Systems, Exxon Office Systems, Mohawk Data Science, and Index Terminals in product development and quality assurance disciplines. Jean-Luc Albert received his Bachelor of Science in Computer Science and graduated Magna Cum Laude from Louisiana State University in Shreveport. Prior to joining Micromeritics, Mr. Albert did software development for Simtrol and worked on developing videoconferencing systems that provided centralized control for multiple devices in real-time. Jeff Gantner earned his Bachelor's Degree in Mathematics/Computer Science from Florida State University and has over 25 years of experience in software development. Mr. Gantner came to Micromeritics from VSI/Simtrol, a company specializing in videoconferencing and real-time device control. Prior to joining Micromeritics Leo Guray (Masters of Science from the University of Vilnius, one of the oldest universities in Central and Eastern Europe founded in 1579) developed medical, analytical instrument management, and business software. As an undergraduate at the University of Minnesota, Derek Dolney earned BS degrees in physics and chemistry and published a paper in the Journal of Computational Chemistry. As a graduate student at the University of Pennsylvania, Derek was involved in cosmology research, mostly simulating and modeling structure formation in the universe. His graduate work yielded three more publications and earned him a PhD in physics. Stefan Koch states, “Our mission is to develop software that gets the maximum functionality out of Micromeritics instruments. We continually consult with our applications scientists and review technical articles to stay on the cutting-edge. We are dedicated to getting the most reliable data possible and reporting that data in a way the customer wants to see with a consistent easy-to-use interface across our entire range of instruments.” Micromeritics manufactures automated particle characterization, analytical laboratory instruments for R&D, QA/QC, production, and process control applications. Characteristics determined include: particle size, surface area, pore volume, pore size, pore size distribution, absolute density, envelope density, bulk density, catalytic activity, and active surface area. Our software development and support capability is one of the reasons Micromeritics is a leader in the field of particle characterization instrumentation.