With an unrivalled resolution and dynamic range, the PIXcel1D can be used with all of our diffractometers.
Overview
From X-ray powder diffraction to high-resolution thin film studies
The PIXcel1D covers a wide range of 1D applications requiring the medium and lower energy radiation wavelengths namely Cu, Co, Fe, Mn, Cr:
- Phase identification and high throughput screening
- Standardless quantification of mixtures of phases
- Refinement of crystal structures
- Phase transitions at non-ambient conditions in combination with our in situ stages
- Residual stress, texture and phase identification of metals and alloys
- Powder diffraction from large unit cell crystals
- Thin film studies.
Specification
| Type | PIXcel1D detector with Medipix3 |
|---|---|
| Window size | 14 mm x 14 mm |
| Efficiency Cu K | >95% |
| 99% Linearity range | 0 – 6.5 x 109 cps – Overall
0 - 25 x 106 cps - Column |
| Energy resolution around Cu K | 18% |
| Maximum count rate | Maximum count rate 30 x 109 cps – Overall
120 x 106 cps - Column |
| Maximum background | <0.5 cps - Overall |
| Active length | 14 mm |
| Smallest step size | 0.0016º 2θθ at 240 mm goniometer radius |
| Supported wavelengths | Cu, Co, Fe, Mn, Cr |
| Defective channels | 0 |
